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硅酸盐通报 ›› 2023, Vol. 42 ›› Issue (5): 1841-1851.

所属专题: 陶瓷

• 陶瓷 • 上一篇    下一篇

Sn掺杂CeO2中Ce3+的形成机制及其对质子交换膜燃料电池耐久性的影响

涂自强1, 何漩1, 杜星1, 陈辉1, 赵雷1, 张海军1, 王诚2   

  1. 1.武汉科技大学耐火材料与冶金省部共建国家重点实验室,武汉 430081;
    2.清华大学张家港氢能与先进锂电技术联合研究中心,北京 100000
  • 收稿日期:2023-01-28 修订日期:2023-03-17 出版日期:2023-05-15 发布日期:2023-06-01
  • 通信作者: 何 漩,博士,副教授。E-mail:xuan.he@wust.edu.cn
  • 作者简介:涂自强(1999—),男,硕士研究生。主要从事燃料电池的研究。E-mail:tzq19990921@163.com
  • 基金资助:
    国家自然科学基金(22105151,51802234)

Formation Mechanism of Ce3+ in Sn-Doped CeO2 and Its Effect on Durability of Proton Exchange Membrane Fuel Cells

TU Ziqiang1, HE Xuan1, DU Xing1, CHEN Hui1, ZHAO Lei1, ZHANG Haijun1, WANG Cheng2   

  1. 1. The State Key Laboratory of Refractories and Metallurgy, Wuhan University of Science & Technology, Wuhan 430081, China;
    2. Zhang Jiagang Joint Institute for Hydrogen Energy and Lithium-Ion Battery Technology, Tsinghua University, Beijing 100000, China
  • Received:2023-01-28 Revised:2023-03-17 Online:2023-05-15 Published:2023-06-01

摘要: 在质子交换膜燃料电池(PEMFC)运行过程中,产生的自由基会攻击质子交换膜,使其开裂或形成孔洞,导致电池失效。常见的改性方法是在质子交换膜(PEM)中添加自由基清除剂材料。基于此,本文合成了Sn掺杂CeO2自由基清除剂,通过提高Ce3+浓度来增强其在PEMFC中自由基清除性能,避免PEM厚度迅速减薄,从而提高质子PEMFC的耐久性。密度泛函理论计算和试验结果表明,Sn掺杂会引起CeO2产生晶格畸变,降低氧空位形成能,促进CeO2中Ce3+的形成。同时,Sn2+的加入可将CeO2-Sn样品中的Ce4+还原为Ce3+,提升Ce3+的浓度,从而提高PEM的耐久性。单电池测试结果表明,经70 h的开路电压衰减测试,CeO2-Sn-5%改性后的质子交换膜组装的单电池电压衰减率最低(18%),且功率保留率(56%)比其他样品更高,表明该样品具有更优异的耐久性。

关键词: CeO2, Sn掺杂, 密度泛函理论计算, 氧空位, 质子交换膜燃料电池, 耐久性

Abstract: During the operation of a proton exchange membrane fuel cell (PEMFC), free radicals generated by PEMFC usually attack proton exchange membrane (PEM), causing the formation of crack or holes, which make the cell failure. Adding free radical scavenger material into PEM is regarded as a commonly modification method. Here, a Sn-doped CeO2 free radical scavenger was synthesized. By increasing the concentration of Ce3+, the free radical scavenging performance of CeO2 in PEMFC could be enhanced, which could avoid PEM thickness to decrease rapidly, and the durability of PEMFC could be improved. Density functional theory calculation and experimental results show that Sn-doping can cause lattice distortion of CeO2, reduce the formation energy of oxygen vacancy, and improve the formation of Ce3+ in CeO2. At the same time, the addition of Sn2+ can reduce Ce4+ in CeO2-Sn to form Ce3+, which is conducive to increasing the concentration of Ce3+ and thus improving the durability of PEM. The results of single cell test show that the voltage attenuation rate of the single cell assembled with CeO2-Sn-5% modified is the lowest (18%) and the power retention rate (56%) of the single cell is higher than that of other PEM after 70 h open circuit voltage decay test, which indicates that the sample has better durability.

Key words: CeO2, Sn-doping, density functional theory calculation, oxygen vacancy, PEMFC, durability

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