[1] WAN W, FENG Y B, YANG J, et al. Microstructure, mechanical and high-temperature dielectric properties of zirconia-reinforced fused silica ceramics[J]. Ceramics International, 2016, 42(5): 6436-6443. [2] ZHAI D, WEI C, ZHANG F C, et al. Microwave transmission performance of fused silica ceramics in microwave high-temperature heating[J]. Ceramics International, 2019, 45(5): 6157-6162. [3] DUAN W J, YANG Z H, CAI D L, et al. Effect of sintering temperature on microstructure and mechanical properties of boron nitride whisker reinforced fused silica composites[J]. Ceramics International, 2020, 46(4): 5132-5140. [4] WAN W, YANG J, FENG Y B, et al. Effect of trace alumina on mechanical, dielectric, and ablation properties of fused silica ceramics[J]. Journal of Alloys and Compounds, 2016, 675: 64-72. [5] 闫法强,陈 斐,沈 强,等.放电等离子烧结技术制备熔融石英陶瓷[J].硅酸盐通报,2007,26(2):362-365+381. YAN F Q, CHEN F, SHEN Q, et al. Fabrication of fused silica ceramics by spark plasma sintering technique[J]. Bulletin of the Chinese Ceramic Society, 2007, 26(2): 362-365+381 (in Chinese). [6] 徐常明,王士维,黄校先,等.无压烧结制备Si3N4/SiO2复合材料[J].无机材料学报,2006,21(4):935-938. XU C M, WANG S W, HUANG X X, et al. Preparation of Si3N4/SiO2 composites with pressureless sintering[J]. Journal of Inorganic Materials, 2006, 21(4): 935-938 (in Chinese). [7] 卜景龙,王志发,窦光涛,等.熔融石英陶瓷材料的晶化抑制研究[J].稀有金属材料与工程,2007,36(S1):357-360. BU J L, WANG Z F, DOU G T, et al. Study on inhibiting crystallization of fused quartz ceramic materials[J]. Rare Metal Materials and Engineering, 2007, 36(S1): 357-360 (in Chinese). [8] 郑 斌,刘家臣,杜海燕,等.氮化硼对熔融石英析晶行为的影响[J].稀有金属材料与工程,2013,42(S1):370-372. ZHENG B, LIU J C, DU H Y, et al. Effect of boron nitride on crystallization of the quartz ceramics[J]. Rare Metal Materials and Engineering, 2013, 42(S1): 370-372 (in Chinese). [9] LI J Q, ZHANG Y J, LI G Z. Preparation and characterization of SiBON fiber[J]. Materials Letters, 2012, 89: 266-268. [10] 范叶明.SiBON玻璃陶瓷的塑性成形与反应热处理工艺研究[D].哈尔滨:哈尔滨工业大学,2008. FAN Y M. Research on plastic forming and reaction heat treatment process of SiBON glass ceramics[D]. Harbin: Harbin Institute of Technology, 2008 (in Chinese). [11] 吴 赟.基于Si3N4-B2O3反应的SiBON陶瓷及天线罩制备工艺与性能研究[D].哈尔滨:哈尔滨工业大学,2011. WU Y. Research on preparation process and performance of SiBON ceramics and radome based on Si3N4-B2O3 reactions[D]. Harbin: Harbin Institute of Technology, 2011 (in Chinese). [12] 张文宇,郑 勇,程 鹏,等.表面析晶对熔融石英微波介电性能的影响[J].电子元件与材料,2014,33(6):34-37+41. ZHANG W Y, ZHENG Y, CHENG P, et al. Effects of surface crystallization on the microwave dielectric properties of fused silica[J]. Electronic Components and Materials, 2014, 33(6): 34-37+41 (in Chinese). [13] 周莹莹,孙润军,张昭环,等.氮化硼合成的工艺及性能研究[J].硅酸盐通报,2017,36(1):186-190. ZHOU Y Y, SUN R J, ZHANG Z H, et al. Process and properties of boron nitride synthesis[J]. Bulletin of the Chinese Ceramic Society, 2017, 36(1): 186-190 (in Chinese). [14] 陈和生,孙振亚,邵景昌.八种不同来源二氧化硅的红外光谱特征研究[J].硅酸盐通报,2011,30(4):934-937. CHEN H S, SUN Z Y, SHAO J C. Investigation on FT-IR spectroscopy for eight different sources of SiO2[J]. Bulletin of the Chinese Ceramic Society, 2011, 30(4): 934-937 (in Chinese). [15] LIU J, WANG Q H, LI Y W, et al. Inhibiting crystallization of fused silica ceramic at high temperature with addition of α-Si3N4[J]. Ceramics International, 2021, 47(8): 11394-11404. [16] SORARÙ G D, DALLABONA N, GERVAIS C, et al. Organically modified SiO2-B2O3 gels displaying a high content of borosiloxane (B-O-Si) bonds[J]. Chemistry of Materials, 1999, 11(4): 910-919. [17] MIURA Y, KUSANO H, NANBA T, et al. X-ray photoelectron spectroscopy of sodium borosilicate glasses[J]. Journal of Non-Crystalline Solids, 2001, 290(1): 1-14. [18] BOIS L, L'HARIDON P, LAURENT Y, et al. Characterization of a boro-silicon oxynitride prepared by thermal nitridation of a polyborosiloxane[J]. Journal of Alloys and Compounds, 1996, 232(1/2): 244-253. [19] AHMAD M, ZHAO J, PAN C F, et al. Ordered arrays of high-quality single-crystalline α-Si3N4 nanowires: synthesis, properties and applications[J]. Journal of Crystal Growth, 2009, 311(20): 4486-4490. [20] LEE K S, KIM Y S, TOSA M, et al. Mechanical properties of hexagonal boron nitride synthesized from film of Cu/BN mixture by surface segregation[J]. Applied Surface Science, 2001, 169/170: 420-424. [21] GREEN M L, GUSEV E P, DEGRAEVE R, et al. Ultrathin (<4 nm) SiO2 and Si-O-N gate dielectric layers for silicon microelectronics: understanding the processing, structure, and physical and electrical limits[J]. Journal of Applied Physics, 2001, 90(5): 2057-2121. [22] HUANG Y, YANG Z, LIU H, et al. XPS study on microporous surface composition of microchannel plates[J]. The International Society for Optical Engineering, 2011, 8194(3): 91-94. [23] DING W Y, LI L, ZHANG L N, et al. An XPS study on the chemical bond structure at the interface between SiOxNy and N doped polyethylene terephthalate[J]. The Journal of Chemical Physics, 2013, 138(10): 104706. [24] GOUIN X, GRANGE P, BOIS L, et al. Characterization of the nitridation process of boric acid[J]. Journal of Alloys and Compounds, 1995, 224(1): 22-28. |