Contact Characteristics of G/FTO Bilayer Films Based on Atomic Force Microscopy

Abstract

Abstract: Single layer graphene (G) and fluoride doped tin dioxide(FTO) thin film were compounded together by wet etching method. The structure, surface and interface topography and elemental distribution of G/FTO bilayer film were investigated by Raman spectroscopy, focused ion beam (FIB) and transmission electron microscopy (TEM). The topography, contact potential difference (CPD), work function and contact barrier of FTO film and G/FTO bilayer film were investigated using Kelvin probe force microscopy (KPFM) and conductive atomic force microscopy (C-AFM) based on atomic force microscopy (AFM). The results show that the contact potential difference of FTO film and G/FTO bilayer film is -0.474 and -0.441 V, respectively, and the work function of the two films is 5.329 and 5.296 eV, respectively. Compared with FTO film, the mobility of G/FTO bilayer film increases from 21.26 cm²·V^-1·s^-1 to 23.82 cm²·V^-1·s^-1. The corresponding barrier height of FTO film and G/FTO bilayer film is (0.39±0.06) V and (0.33±0.05) V, respectively, and the barrier height of G/FTO bilayer film is smaller.

Key words: graphene, fluorine doped tin dioxide, bilayer structure, contact characteristic, contact potential difference, work function, contact barrier

CLC Number:

WANG Min, CAI Wenhao, YU Jianyuan, WANG Zhihao, ZHOU Haozhe, ZHAO Hongli. Contact Characteristics of G/FTO Bilayer Films Based on Atomic Force Microscopy[J]. BULLETIN OF THE CHINESE CERAMIC SOCIETY, 2023, 42(6): 2262-2272.

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