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WU Zhong-hua;BIAN Da;ZHAO Yong-wu.
SiO2 Nanoparticles Removal from 7003 Aluminum Alloy Surface in Post-CMP Cleaning
[J]. BULLETIN OF THE CHINESE CERAMIC SOCIETY, 2017, 36(4): 1149-1153.
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XU Lai-jun;NI Zi-feng;CHEN Guo-mei;BAI Ya-wen;ZHAO Yong-wu.
Synthesis and Characterization of CeO2/SiO2 Composite Particles
[J]. BULLETIN OF THE CHINESE CERAMIC SOCIETY, 2016, 35(11): 3855-3858.
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ZHUANG Xiao-kai;LI Qing-zhong.
Detection of Subsurface Damage of Wafer Polished by Ultrasonic Atomization CMP
[J]. BULLETIN OF THE CHINESE CERAMIC SOCIETY, 2015, 34(8): 2291-2297.
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YANG Shuai;CHEN Gui-feng;WANG Yong.
FTIR Study of Amorphous Region in Fast Neutron Irradiated Czochralski Silicon
[J]. BULLETIN OF THE CHINESE CERAMIC SOCIETY, 2014, 33(10): 2468-2471.
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CAI Li-li;FENG Cui-ju;CHEN Gui-feng.
Effect of Annealing Atmosphere on Oxygen Precipitation in Electron Irradiated Czochralski Silicon
[J]. BULLETIN OF THE CHINESE CERAMIC SOCIETY, 2014, 33(7): 1802-1805.
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GAO Song;WANG Gui-lin;FAN Ming-jie.
Preparation and Characterization of Mesoporous TiO2 by Microemulsion Method
[J]. BULLETIN OF THE CHINESE CERAMIC SOCIETY, 2013, 32(2): 294-298.
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YANG Shuai;DENG Xiao-ran;XU Jian-ping;CHEN Gui-feng;ZHANG Hui.
The Influence of Neutron Dose on the Annealing of VO in Czochralski Silicon
[J]. BULLETIN OF THE CHINESE CERAMIC SOCIETY, 2013, 32(2): 352-355.
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YANG Shuai;DENG Xiao-ran;XU Jian-ping;CHEN Gui-feng;YAN Wen-bo.
Annealing Behaviors of Divacancies in Fast Neutron Irradiated Silicon
[J]. BULLETIN OF THE CHINESE CERAMIC SOCIETY, 2010, 29(4): 779-783.
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